You use this activity to create or edit test plans that are used by automated testing equipment or other equipment that can accept a structured parameter set for execution.
Data is collected during the manufacturing process using machine interfaces. The equipment provides parametric data using the values specified in the test plan.
The equipment passes test results back to SAP ME for reporting and optional historical SPC data analysis (see Statistical Process Control (SPC)). The collected data is stored against an SFC number.
The following tables describe fields requiring explanation:
Field | Description |
---|---|
Test Plan | The unique ID for identifying the test plan |
Generate ID | Generates a unique ID number for this test plan (optional) |
Field | Description |
---|---|
Insert Parent Measurement | Displays the Measurement Details screen where you can add a new measurement to this test plan |
Insert Child Measurement | Displays the Measurement Details screen where you can add a new child measurement to this test plan |
Measurement | The unique identifier of the measurement |
Low | The minimum acceptable measurement value |
High | The maximum acceptable measurement value |
Status | If enabled, the measurement is taken within this test plan |
Field | Description |
---|---|
Sequence | The order of the test plan parameters |
Parameter Name | The name of the test plan parameter |
Parameter Value | The value of the test plan parameter |
Field | Description |
---|---|
Material/Vers. | The material that is measured according to this test plan |
Operation | The operation at which the measurements must be taken |
Routing/Vers. | The routing at which the measurements must be taken |
Resource | The resource at which the measurements must be taken |
Attribute | The special identifier for this test plan group |
Current Vers. | If selected, applies this test plan to the current version |
Details | Displays the Attachment Point Details screen that allows you to set up or change the attachment |
Field | Description |
---|---|
Parent Measurement ID | The ID of the measurement that is a parent for the measurement selected in Test Plan Maintenance |
Tolerance Limit | If selected, the tolerance limits are defined by the external source (for example, test machine) |
Field | Description |
---|---|
Sequence | The order of measurement limits |
Spec Low Limit | The minimum acceptable measurement value per specification |
Spec High Limit | The maximum acceptable measurement value per specification |